Conference Contributions (1)

• Schneider, S.; Kramer, A.; Eppler, F.; Alemye, H.; Hubner, C.; Mikonsaari, I.; Leuthold, J.; Freude, W.; Koos, C.
  Polarization-Sensitive Optical Coherence Tomography for Characterization of Size and Shape of Nano-Particles
  Conf. on Lasers and Electro-Optics (CLEO'13), San Jose (CA), USA, June 9–14 , AF1J.4 Optical Society of America (2013) [DOI]