Publications of 2017

Journal Articles (1)

• Weimann, C.; Lauermann, M.; Hoeller, F.; Freude, W.; Koos, C.
  Silicon photonic integrated circuit for fast and precise dual-comb distance metrology
  Opt. Express 25, 30091--30104 (2017) [DOI]

Conference Contributions (2)

• Koos, C.; Freude, W.; Guber, A. E.; Schimmel, T.; Lauermann, M.; Schneider, S.; Weimann, C.; Muehlbrandt, S.; Harter, T.; Wondimu, S. F.; Wienhold, T.; von der Ecken, S.; Dietrich, P.-I.; Goering, G.
  Photonic Integration for Metrology and Sensing
  OSA Integrated Photonics Research, Silicon, and Nano- Photonics (IPR), New Orleans, Louisiana, USA, 24 - 27 July , paper ITh1A.1. (2017) [DOI] (invited)


• Koos, C.; Kippenberg, T. J.; Barry, L. P.; Ramdane, A.; Lelarge, F.; Freude, W.; Marin-Palomo, P.; Kemal, J. N.; Weimann, C.; Wolf, S.; Trocha, P.; Pfeifle, J.; Karpov, M.; Kordts, A.; Brasch, V.; Watts, R. T.; Martinez, A.; Panapakkam, V.; Chimot, N.
  Chip-scale frequency comb generators for high-speed communications and optical metrology
  SPIE Nonlinear Frequency Generation and Conversion: Materials and Devices XVI, (LASE-SPIE'17), San Francisco (CA), USA, Jan. 28 - Feb. 2 , paper 10090-15 (2017) [DOI] (invited)