Lectures (2)

• Freude, W.; Schneider, S.; Weimann, C.; Hoeller, F.; Lauermann, M.; Dietrich, P.-I.; Koos, C.
  Integrated optics for optical coherence tomography and surface topography characterization
  Light: Science & Applications, Light Conference (Light Conference'16, Speakers), Changchun, China, July 4-8 (2016) (invited)


• Schneider, S.; Kramer, A.; Eppler, F.; Alemye, H.; Hubner, C.; Mikonsaari, I.; Freude, W.; Koos, C.
  Polarization-Sensitive Optical Coherence Tomography for Characterization of Size and Shape of Nano-Particles
  115th Annual DGaO Conference (DGaO'14), June 10 - 14, Karlsruhe, Germany (2014)